3VIEW

microtome and digital imaging system, consisting of a microtome, specimen stage, digital control for an electron beam, back-scattered electron detector and computer software for use in controlling the microtome, the position of a specimen and the specimen stage, communicating specifications for magnification, focus, astigmatism and beam blanking to a scanning electron microscope (SEM) column, controlling the position and scanning function of an electron beam, scanning and monitoring images, integrating multiple image frames, coordinating multiple, simultaneous image inputs, controlling the pixel density, pixel dwell time, magnification, focus, aspect ratio and astigmatism of an acquired image; and re-binning image data for export to three dimensional imaging software, all for use with scanning electron microscopes