Mark Identification
3DS
Serial Number
86281743
Filing Date
May 15, 2014
Registration Date
Aug 22, 2017
Trademark by
Classification Information
Probes for testing integrated circuits; Probes for testing semiconductors; Probe cards for use in connection with inspection of semiconductors; Probe cards for testing wafer; Testing apparatus for testing integrated circuits; Testing apparatus for testing semiconductors
Electrical and Scientific Apparatus